PT symmetry breaking in the presence of random, periodic, long-range hopping

dc.contributor.authorHarter, Andrew K.
dc.contributor.authorAssogba Onanga, Franck
dc.contributor.authorJoglekar, Yogesh N.
dc.contributor.departmentDepartment of Physics, School of Scienceen_US
dc.date.accessioned2017-10-06T15:09:28Z
dc.date.available2017-10-06T15:09:28Z
dc.date.issued2016-09
dc.description.abstractOver the past five years, open systems with balanced gain and loss have been investigated for extraordinary properties that are not shared by their closed counterparts. Non-Hermitian, Parity-Time (PT ) symmetric Hamiltonians faithfully model such systems. Such a Hamiltonian typically consists of a reflection-symmetric, Hermitian, nearest-neighbor hopping profile and a PT-symmetric, non-Hermitian, gain and loss potential, and has a robust PT -symmetric phase. Here we investigate the robustness of this phase in the presence of long-range hopping disorder that is not PT-symmetric, but is periodic. We find that the PT-symmetric phase remains robust in the presence of such disorder, and characterize the configurations where that happens. Our results are found using a tight-binding model, and we validate our predictions through the beam-propagation method.en_US
dc.eprint.versionAuthor's manuscripten_US
dc.identifier.citationHarter, A. K., Onanga, F. A., & Joglekar, Y. N. (2016, September). PT symmetry breaking in the presence of random, periodic, long-range hopping. In SPIE Nanoscience+ Engineering (pp. 99201O-99201O). International Society for Optics and Photonics. http://dx.doi.org/10.1117/12.2239527en_US
dc.identifier.urihttps://hdl.handle.net/1805/14259
dc.language.isoenen_US
dc.publisherSPIEen_US
dc.relation.isversionof10.1117/12.2239527en_US
dc.relation.journalPROCEEDINGS VOLUME 9920 SPIE NANOSCIENCE + ENGINEERINGen_US
dc.rightsPublisher Policyen_US
dc.sourceAuthoren_US
dc.subjectPT symmetryen_US
dc.subjectdisorderen_US
dc.subjectwaveguide arraysen_US
dc.titlePT symmetry breaking in the presence of random, periodic, long-range hoppingen_US
dc.typeConference proceedingsen_US
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