Physics-Based Gaussian Process Method for Predicting Average Product Lifetime in Design Stage

dc.contributor.authorWei, Xinpeng
dc.contributor.authorHan, Daoru
dc.contributor.authorDu, Xiaoping
dc.contributor.departmentMechanical and Energy Engineering, School of Engineering and Technologyen_US
dc.date.accessioned2022-03-10T20:46:52Z
dc.date.available2022-03-10T20:46:52Z
dc.date.issued2021-08
dc.description.abstractThe average lifetime or the mean time to failure (MTTF) of a product is an important metric to measure the product reliability. Current methods of evaluating the MTTF are mainly based on statistics or data. They need lifetime testing on a number of products to get the lifetime samples, which are then used to estimate the MTTF. The lifetime testing, however, is expensive in terms of both time and cost. The efficiency is also low because it cannot be effectively incorporated in the early design stage where many physics-based models are available. We propose to predict the MTTF in the design stage by means of a physics-based Gaussian process (GP) method. Since the physics-based models are usually computationally demanding, we face a problem with both big data (on the model input side) and small data (on the model output side). The proposed adaptive supervised training method with the Gaussian process regression can quickly predict the MTTF with a reduced number of physical model calls. The proposed method can enable continually improved design by changing design variables until reliability measures, including the MTTF, are satisfied. The effectiveness of the method is demonstrated by three examples.en_US
dc.eprint.versionAuthor's manuscripten_US
dc.identifier.citationWei, X., Han, D., & Du, X. (2021). Physics-Based Gaussian Process Method for Predicting Average Product Lifetime in Design Stage. Journal of Computing and Information Science in Engineering, 21(4). https://doi.org/10.1115/1.4049509en_US
dc.identifier.urihttps://hdl.handle.net/1805/28125
dc.language.isoenen_US
dc.publisherASMEen_US
dc.relation.isversionof10.1115/1.4049509en_US
dc.relation.journalJournal of Computing and Information Science in Engineeringen_US
dc.rightsPublisher Policyen_US
dc.sourceAuthoren_US
dc.subjectaverage lifetimeen_US
dc.subjectmean time to failureen_US
dc.subjectGaussian process modelen_US
dc.titlePhysics-Based Gaussian Process Method for Predicting Average Product Lifetime in Design Stageen_US
dc.typeArticleen_US
Files
Original bundle
Now showing 1 - 1 of 1
Loading...
Thumbnail Image
Name:
Wei2021physics.pdf
Size:
1.12 MB
Format:
Adobe Portable Document Format
Description:
License bundle
Now showing 1 - 1 of 1
No Thumbnail Available
Name:
license.txt
Size:
1.99 KB
Format:
Item-specific license agreed upon to submission
Description: