Browsing by Subject "focused-ion beam-scanning electron microscopy"

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    In Situ Focused Ion Beam Scanning Electron Microscope Study of Microstructural Evolution of Single Tin Particle Anode for Li-Ion Batteries
    (ACS, 2019-01) Zhou, Xinwei; Li, Tianyi; Cui, Yi; Fu, Yongzhu; Liu, Yuzi; Zhu, Likun; Mechanical and Energy Engineering, School of Engineering and Technology
    Tin (Sn) is a potential anode material for highenergy density Li-ion batteries because of its high capacity, safety, abundance and low cost. However, Sn suffers from large volume change during cycling, leading to fast degradation of the electrode. For the first time, the microstructural evolution of micrometer-sized single Sn particle was monitored by focused-ion beam (FIB) polishing and scanning electron microscopy (SEM) imaging during electrochemical cycling by in situ FIB-SEM. Our results show the formation and evolution of cracks during lithiation, evolution of porous structure during delithiation and volume expansion/contraction during cycling. The electrochemical performance and the microstructural evolution of the Sn microparticle during cycling are directly correlated, which provides insights for understanding Sn-based electrode materials.