Robust Discriminative Metric Learning for Image Representation
dc.contributor.author | Ding, Zhengming | |
dc.contributor.author | Shao, Ming | |
dc.contributor.author | Hwang, Wonjun | |
dc.contributor.author | Suh, Sungjoo | |
dc.contributor.author | Han, Jae-Joon | |
dc.contributor.author | Choi, Changkyu | |
dc.contributor.author | Fu, Yun | |
dc.contributor.department | Computer Information and Graphics Technology, School of Engineering and Technology | en_US |
dc.date.accessioned | 2019-06-28T17:42:15Z | |
dc.date.available | 2019-06-28T17:42:15Z | |
dc.date.issued | 2018-11 | |
dc.description.abstract | Metric learning has attracted significant attentions in the past decades, for the appealing advances in various realworld applications such as person re-identification and face recognition. Traditional supervised metric learning attempts to seek a discriminative metric, which could minimize the pairwise distance of within-class data samples, while maximizing the pairwise distance of data samples from various classes. However, it is still a challenge to build a robust and discriminative metric, especially for corrupted data in the real-world application. In this paper, we propose a Robust Discriminative Metric Learning algorithm (RDML) via fast low-rank representation and denoising strategy. To be specific, the metric learning problem is guided by a discriminative regularization by incorporating the pair-wise or class-wise information. Moreover, low-rank basis learning is jointly optimized with the metric to better uncover the global data structure and remove noise. Furthermore, fast low-rank representation is implemented to mitigate the computational burden and make sure the scalability on large-scale datasets. Finally, we evaluate our learned metric on several challenging tasks, e.g., face recognition/verification, object recognition, and image clustering. The experimental results verify the effectiveness of the proposed algorithm by comparing to many metric learning algorithms, even deep learning ones. | en_US |
dc.eprint.version | Author's manuscript | en_US |
dc.identifier.citation | Ding, Z., Shao, M., Hwang, W., Suh, S., Han, J., Choi, C., & Fu, Y. (2018). Robust Discriminative Metric Learning for Image Representation. IEEE Transactions on Circuits and Systems for Video Technology, 1–1. https://doi.org/10.1109/TCSVT.2018.2879626 | en_US |
dc.identifier.uri | https://hdl.handle.net/1805/19758 | |
dc.language.iso | en | en_US |
dc.publisher | IEEE | en_US |
dc.relation.isversionof | 10.1109/TCSVT.2018.2879626 | en_US |
dc.relation.journal | IEEE Transactions on Circuits and Systems for Video Technology | en_US |
dc.rights | Publisher Policy | en_US |
dc.source | Author | en_US |
dc.subject | metric learning | en_US |
dc.subject | fast low-rank representation | en_US |
dc.subject | denoising strategy | en_US |
dc.title | Robust Discriminative Metric Learning for Image Representation | en_US |
dc.type | Article | en_US |