Robust Discriminative Metric Learning for Image Representation

dc.contributor.authorDing, Zhengming
dc.contributor.authorShao, Ming
dc.contributor.authorHwang, Wonjun
dc.contributor.authorSuh, Sungjoo
dc.contributor.authorHan, Jae-Joon
dc.contributor.authorChoi, Changkyu
dc.contributor.authorFu, Yun
dc.contributor.departmentComputer Information and Graphics Technology, School of Engineering and Technologyen_US
dc.date.accessioned2019-06-28T17:42:15Z
dc.date.available2019-06-28T17:42:15Z
dc.date.issued2018-11
dc.description.abstractMetric learning has attracted significant attentions in the past decades, for the appealing advances in various realworld applications such as person re-identification and face recognition. Traditional supervised metric learning attempts to seek a discriminative metric, which could minimize the pairwise distance of within-class data samples, while maximizing the pairwise distance of data samples from various classes. However, it is still a challenge to build a robust and discriminative metric, especially for corrupted data in the real-world application. In this paper, we propose a Robust Discriminative Metric Learning algorithm (RDML) via fast low-rank representation and denoising strategy. To be specific, the metric learning problem is guided by a discriminative regularization by incorporating the pair-wise or class-wise information. Moreover, low-rank basis learning is jointly optimized with the metric to better uncover the global data structure and remove noise. Furthermore, fast low-rank representation is implemented to mitigate the computational burden and make sure the scalability on large-scale datasets. Finally, we evaluate our learned metric on several challenging tasks, e.g., face recognition/verification, object recognition, and image clustering. The experimental results verify the effectiveness of the proposed algorithm by comparing to many metric learning algorithms, even deep learning ones.en_US
dc.eprint.versionAuthor's manuscripten_US
dc.identifier.citationDing, Z., Shao, M., Hwang, W., Suh, S., Han, J., Choi, C., & Fu, Y. (2018). Robust Discriminative Metric Learning for Image Representation. IEEE Transactions on Circuits and Systems for Video Technology, 1–1. https://doi.org/10.1109/TCSVT.2018.2879626en_US
dc.identifier.urihttps://hdl.handle.net/1805/19758
dc.language.isoenen_US
dc.publisherIEEEen_US
dc.relation.isversionof10.1109/TCSVT.2018.2879626en_US
dc.relation.journalIEEE Transactions on Circuits and Systems for Video Technologyen_US
dc.rightsPublisher Policyen_US
dc.sourceAuthoren_US
dc.subjectmetric learningen_US
dc.subjectfast low-rank representationen_US
dc.subjectdenoising strategyen_US
dc.titleRobust Discriminative Metric Learning for Image Representationen_US
dc.typeArticleen_US
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